-
Melt Chungnam_National_University Organic PinpointPFM FuelCell Neodymium SiliconeOxide Sadowski doped ContactModeDots Mechinical AnodizedAluminumOxide Polydimethylsiloxane Scratch Polyaniline Topography 3-hexylthiophene ItoGlass Steps solar_cell Mechanical align Annealing TappingMode UnivOfMaryland norganic MLCC Piezo atomic_steps AdhesionForce Lateral SelfAssembly Thermoplastic_polyurethane LithiumNiobate OxideLayer
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
CNT Film
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V