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SrO Composition Gold Hafnium_dioxide PS_LDPE HBN InsulatorFilm Oxidation CaMnO3 ContactModeDot BiasMode TiO2 Temperature LightEmission Ni81Fe19 PvdfBead FuelCell BaTiO3 mfm_amplitude Alloy UnivMaryland PolyimideFilm OpticalWaveguide IRDetector Sidewall DeflectionOptics Metal ScanningTunnelingMicroscopy Dimethicone LeakageCurrent Temasek_Lab Film SiliconCrystal Laser Silver
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CNT Film
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V