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Mechanical CVD Forevision Boundary FAFailureAnlaysis Pinpoint PFM PolyimideFilm Force-distance SKPM Electronics TriGlycineSulphate MolecularSelfAssembly Corrosion TemperatureControl Insulator Reduction SiliconeOxide Sidewall hydrocarbon Lateral_Force_Microscopy FM_SKPM InsulatorFilm Lateral LeakageCurrent sputter LiquidCrystal Electical&Electronics FailureAnlaysis TungstenDeposition BiVO4 Hafnia MESA structure Layer Ceramic SSRM
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SnS2 Flakes
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC240TS (k=2N/m, f=70kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.4Hz
- Pixel Size: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC240TS (k=2N/m, f=70kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.4Hz
- Pixel Size: 256 × 256