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AdhesionEnergy DOE SmallScan Pinpoint piezoelectric force microscopy InorganicCompound NUS_NNI_Nanocore cannabidiol Hafnium_dioxide layers FFM PFM Ferroelectric BoronNitride HumanHair Sio2 AM-KPFM Pores PiezoelectricForceMicroscopy OpticalWaveguide PetruPoni_Institute MolecularSelfAssembly Protein Beads Polystyrene Organic Optic TempControl ThermalDetectors PVA Spain small_scan Yttria_stabilized_Zirconia sputter mfm_amplitude
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MoS2 Layers on SiO2
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel Size: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel Size: 256 × 256