-
Strontium GaP food Bismuth ContactModeDots Polyurethane MembraneFilter graphene_hybrid PetruPoni Polyvinylidene ContactModeDot ferromagnetic Annealed PVA CVD TCS KAIST Regensburg UnivOfMaryland ElectroDeposition Polyaniline organic_polymer doped Anneal SiWafer Yeditepe Conductive AFM Topography Fujian CP-AFM AM_KPFM Thermal InsulatorFilm Worcester_Polytechnic_Institute Vacuum
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
MoS2 Layers on SiO2
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel Size: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel Size: 256 × 256