-
Roughness SRAM Blend single_layer InorganicCompound ScanningThermalMicroscopy dielectric_trench Cobalt SSRM Dr.JurekSadowski NUS_NNI_Nanocore PyroelectricDetector ScanningIon-ConductanceMicroscopy MembraneFilter DomainSwitching Pipette Ceramic Multiferroic_materials Jason HighAspect cooling molecular_beam Laser VerticalPFM NUSNNI CuParticle Tapping University_of_Regensburg TemperatureControlledAFM F14H20 YszSubstrate UnivCollegeLondon NeodymiumMagnets temp_control IndiumTinOxide