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Sio2 pinpoint mode CompactDisk Chemical_Vapor_Deposition TemperatureControlledAFM molecule ElectroChemical FrictionalForceMicroscopy VerticalPFM Patterns Defects LifeScience MembraneFilter Mechinical Ceramics Hydroxyapatite semifluorinated_alkanes HardDisk LithiumNiobate TipBiasMode Titanate SrO Nickel AtomicLayer Metal-organicComplex Semiconductor Mosfet Optic molecular_beam TyphimuriumBiofilm Microchannel OpticalWaveguide Workfunction Oxidation small_scan
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Polymers
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 1Hz
- Pixel: 512×512