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PvdfFilm BFO exfoliate Annealing single_layer DiffractiveOpticalElements TemperatureControl Organic NCM\ IIT-chennai PS_PVAC PS_LDPE FastScan temperature_control C36H74 GalliumPhosphide AmplitudeModulation cooling Electical&Electronics Deposition Laser Battery Blend Indium_tin_oxide Photovoltaics PinpointNanomechanicalMode tip_bias_mode Magnetic Silver PhaseChange Step Leakage Conductive AFM IMT_Bucharest ScanningThermalMicroscopy
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Co/Cr/Pt
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Lift height: 40nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Lift height: 40nm