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TemperatureControl Anneal Polydimethylsiloxane temperature controller AFM YttriaStabilizedZirconia Sulfur Modulus Formamidinium_lead_iodide PhaseTransition Silver Growth self-assembled_monolayer ElectrostaticForceMicroscopy Indium_tin_oxide TCS ThermalConductivity LFM Imprint Neodymium Roughness MembraneFilter ring shape PolymerPatterns BiasMode Lanthanum_aluminate YszSubstrate AdhesionEnergy CrAu Current small_scan ULCA HACrystal ForceVolumeImage ScanningIon-ConductanceMicroscopy TungstenDeposition
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hBN-few layer Graphene
Scanning Conditions
- System : NX10
- Sample bias: 1.75 V
- Scan Mode: C-AFM
- Scan Rate : ALL 0.5Hz
- Scan Size : 200nm×200nm
- Pixel Size : 2048×2048
- Cantilever : AD-2.8-AS (k=2.8N/m, f=75kHz)