-
lithography hetero_structure Grain Wafer high_resolution Pzt LateralForce PS_PVAC CNT Hair temperature controller AFM TCS Topography Graphite ElectrostaticForceMicroscopy Gong 2d_materials ElectroChemical ForceVolume NUS C_AFM Alloy Chloroform solar_cell atomic_steps PVAP3HT Worcester_Polytechnic_Institute Mosfet Sperm phase_change Anneal ThermalConductivity Microchannel AIN PECurve
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
C36H74
Layer of C36H74 alkane on HOPG.
Scanning Conditions
- System: NX20
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel Size: 512 × 256
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel Size: 512 × 256