-
AM-KPFM Inorganic_Compound PyroelectricDetector MeltingPoint Beads LMF FrequencyModulation UTEM Annealing neodymium_magnets Indium_tin_oxide LithiumNiobate Piezoresponse Dental Tapping PolymerBlend Electrical&Electronics PinpointNanomechanicalMode Aluminium_Oxide P3HT LiftHeight LateralPFM CrystalGrowing Vac Varistor Galfenol CntFilm Techcomp SRAM Scanning_Thermal_Microscopy TriGlycineSulphate Chloroform PolymerPatterns Cross-section WWafer
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Crystal
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 2μm×2μm
- Scan Rate: 0.7Hz
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 2μm×2μm
- Scan Rate: 0.7Hz
- Pixel: 256 × 256