-
semifluorinated_alkane mechanical_property CrAu ChemicalCompound HexacontaneFilm SurfaceChange ElectrostaticForceMicroscopy domain_switching Wang CeramicCapacitor Self-assembledMonolayer Heating FAFailureAnlaysis Oxide thermoplastic_elastomers CrossSection CrystalGrowing TemperatureControl Crystal BoronNitride CntFilm PatternedSapphireSubstrat SingleCrystal Polyimide Ptfe KPFM cooling Liquid LightEmiting ItoGlass NCM\ Butterfly SrTiO3 Growing Pinpoint
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Anodized Aluminum Oxide (AAO)
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS
- Scan Size: 0.5Hz, 1Hz
- Scan Rate:20μm×20μm, 5μm×5μm
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC160TS
- Scan Size: 0.5Hz, 1Hz
- Scan Rate:20μm×20μm, 5μm×5μm
- Pixel: 256 × 256