-
HfO2 optoelectronics suspended_graphene Molybdenum_disulfide Morphology Mfm HBN AM_KPFM IcelandSpar CastIron ForceDistanceSpectroscopy Tape Optical Boron Protein strontiu_titanate DeflectionOptics Copolymer ScanningThermalMicroscopy NCM Liquid HexagonalBN heterojunctions Topography PDMS Aluminum ScanningSpreadingResistanceMicroscopy Fet STM Melt DNA Dopped Solution Defect Non-ContactMode
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
LiNbO3 wafer
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size:20μm×20μm, 2.5μm×2.5μm
- Scan Rate: 5Hz, 10Hz
- Pixel: 512×512, 256×256
- Scan Mode: Non-contact
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size:20μm×20μm, 2.5μm×2.5μm
- Scan Rate: 5Hz, 10Hz
- Pixel: 512×512, 256×256