-
LiBattery NUS_Physics Subhajjit F14H20 Potential Au111 Stiffness Materials ContactModeDots YttriaStabilizedZirconia HighResolution PUR CrossSection HardDiskMedia Typhimurium Fiber Fluoride Carbon Ca10(PO4)6(OH)2 hard_disk Calcium single_layer Multiferroic_materials DIWafer Ananth Magnetic SiWafer Mosfet nanomechanical HOPG LifeScience ThermalDetectors Tin disulfide LiquidImaging Switching
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
SiC MOSFET
Scanning Conditions
- System: NX-Hivac
- Scan Mode: SSRM
- Cantilever: Full diamond (k=27 N/m)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×512
- Sample Bias: +2.5V
- Scan Mode: SSRM
- Cantilever: Full diamond (k=27 N/m)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×512
- Sample Bias: +2.5V