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Electrode MfmPhase LiIonBattery Switching AnodizedAluminumOxide AlkaneFilm gallium_nitride MoirePattern OrganicSemiconductor SFAs TPU SICM PinpointNanomechanicalMode BTO SRAM SSRM Laser single_layer PolyvinylAcetate layers 2dMaterials SurfaceChange temperature_control Graphene CuParticle Optical contact PolycrystallineFerroelectricBCZT TungstenThinFilmDeposition HanyangUniv UnivCollegeLondon LiBattery CP-AFM Chungnam_National_University Al2O3
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Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256