-
Silicon Conduct Alkane optoelectronics Austenite self-assembled_monolayer hard_disk_media DOE NCM\ Cobalt-dopedIronOxide Fendb Optical STM Tungsten_disulfide WWafer VinylAlcohol self-assembly SmallScan SingleCrystal GlassTemperature FAPbI3 Vortex MetalCompound rubber ThermalDetectors MolecularSelfAssembly alkanes Litho C36H74 Reduction Cross-section PiezoelectricForceMicroscopy sputter Trench Polydimethylsiloxane
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Floppy
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256