-
single_layer multi_layer Chrome Polytetrafluoroethylene SThM INSPParis HOPG SiWafer Polyaniline SiliconOxide Conductivity AlkaneFilm CeNSE_IISc Forevision ThinFilm PhaseTransition PVAC AM_KPFM China DNA PyroelectricDetector Phenanthrene ScanningSpreadingResistanceMicroscopy MechanicalProperties layers Ceramic Ecoli Granada Hexacontane CopperFoil Terrace SKPM Yttria_stabilized_Zirconia NanoLithography Moire
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Polymer patterns on Si (2/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=1N/m, f=90kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.2Hz
- Pixel: 512×256