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Adhesion aluminum_nitride CastIron Vacuum LowDensityPolyethylene TungstenThinFilmDeposition doped OrganicSemiconductor Photovoltaics HighAspect SingleLayer LogAmplifier Hysteresys Wafer EFMAmplitude DNA MultiferroicMaterials PolyvinylideneFluoride temp MagneticPhase bias_mode SetpointMode Tungsten_disulfide Jason Cobalt-dopedIronOxide Ca10(PO4)6(OH)2 PyroelectricDetector CVD SrTiO3 StainlessSteel mfm_amplitude ForceVolumeMapping NanoLithography Phenanthrene self_healing
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HOPG
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=2N/m, f=130kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×512