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Melt Yttria_stabilized_Zirconia HexacontaneFilm Wonseok PinpointPFM single_layer Solar self-assembled_monolayer Nickel Dental Chemical_Vapor_Deposition TemperatureControllerStage Friction LiquidCrystal KAIST F14H20 Crystal MagneticPhase HafniumDioxide Composition Indent PinPointMode molecule Strontium Logo bias_mode BoronNitride Hexylthiophene AlkaneFilm amplitude_modulation dielectric trench temperature controller AFM ScanningTunnelingMicroscopy OpticalElement Copolymer
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Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=2N/m, f=130kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×512