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dielectric trench DiffractiveOpticalElements FrictionalForceMicroscopy Roughness PinpointNanomechanicalMode HexagonalBoronNitride University_of_Regensburg LifeScience AtomicSteps LiquidImaging Aggregated_molecules Dr.JurekSadowski alkanes Nickel ThermalConductivity Heating FastScan AAO Polarization Phosphide SurfaceOxidation INSPParis Magnetostrictive CntFilm ULCA LiquidCell cannabinoid Electrode Defects Sidewall PiezoelectricForceMicroscopy CalciumHydroxyapatite Molybdenum_disulfide layers Ca10(PO4)6(OH)2
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Multi-layer necking device defect
Scanning Conditions
- System : NX-Wafer
- Scan Mode: C-AFM
- Scan Rate : 2Hz
- Scan Size : 2μm×2μm
- Pixel Size : 512×256
- Cantilever : AD-2.8-AS (k=2.8N/m, f=75kHz)