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Holes CeramicCapacitor HighResolution FrictionForce EFMAmplitude temp_control nanobar MoirePattern PolymerPatterns Sulfur BaTiO3 SSRM Melt HACrystal Gold Pinpoint #EC MfmPhase Au111 ThermalDetectors norganic 3-hexylthiophene HighAcpectRatio Platinum rubber thermal_property Wildtype Korea FailureAnalysis CeNSE_IISc IcelandSpar Solar Etch SiliconCrystal PDMS
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Multi-layer necking device defect
Scanning Conditions
- System : NX-Wafer
- Scan Mode: C-AFM
- Scan Rate : 2Hz
- Scan Size : 2μm×2μm
- Pixel Size : 512×256
- Cantilever : AD-2.8-AS (k=2.8N/m, f=75kHz)