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Cross-section IVSpectroscopy DOE Defect Morphology Silicon StrontiuTitanate PS_LDPE GlassTemp MechanicalProperties thermoplastic_elastomers FuelCell BlockCopolymer BiVO4 frequency_modulation semifluorinated alkane blended polymers KevlarFiber Conducting ReflexLens Switching GranadaUniv AtomicLayer ElectrostaticForceMicroscopy CalciumHydroxide CrAu LiBattery Granada layers AnodizedAluminumOxide SKPM Thermal Molybdenum_disulfide Lateral_Force_Microscopy FrictionalForceMicroscopy
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CMP test key
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 1Hz for 100μm2 / 1.5Hz for 30μm2
- Scan Size : 100μm2, 30μm2
- Pixel Size : All 1024×512
- Cantilever : CMCL-AC240TS (k=2N/m, f=70kHz)