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LFM Transparent GalliumPhosphide Polydimethylsiloxane DomainSwitching #Materials PiezoelectricForceMicroscopy Magnets lift_mode Lateral hard_disk NUS Chemical_Vapor_Deposition LateralForceMicroscopy Ananth MoS2 high_resolution Defects HexagonalBN dichalcogenide Singapore PolyimideFilm FAFailureAnlaysis 2dMaterials atomic_layer ThermalDetectors PUR Praseodymium Friction Steps Change oxide_layer PS_LDPE bias_mode Polarization
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CMP test key
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 1Hz for 100μm2 / 1.5Hz for 30μm2
- Scan Size : 100μm2, 30μm2
- Pixel Size : All 1024×512
- Cantilever : CMCL-AC240TS (k=2N/m, f=70kHz)