-
optoelectronics CuSubstrate bias_mode PhaseImaging Pores TungstenDeposition Pinpoint TransitionMetal Inorganic_Compound Praseodymium flakes tip_bias_mode TPU InorganicCompound C36H74 KAIST Chloroform fe_nd_b PolymerPatterns ThermalConductivity SThM IVSpectroscopy frequency_modulation Pore semifluorinated_alkane self_healing GlassTemp AEAPDES NanoLithography IIT-chennai LiquidCell AnodizedAluminumOxide LiquidCrystal HexacontaneFilm AM_SKPM
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Defect of LinbO₃
Scanning Conditions
- System : FX40
- Scan Mode: Non-contact
- Scan Rate : 0.3 Hz
- Scan Size : 10μm×10μm
- Pixel Size : 1024×512
- Cantilever : SCOUT 350 (k=42N/m, f=350kHz)