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PtfeFilter Corrosion ForceDistanceSpectroscopy TPU PolyStylene Sio2 Aluminium_Oxide Tapping ThermalConductivity Alloy Resistance ForceMapping alkanes FrequencyModulation CastIron Styrene Metal-organicComplex Defects strontiu_titanate PolyvinylideneFluoride TungstenDeposition ferromagnetic HighAspect Dopped OpticalElement cannabinoid GlassTemp PUR PinpointPFM SelfAssembly cooling Scanning_Thermal_Microscopy Cobalt-dopedIronOxide ScanningTunnelingMicroscopy GalliumPhosphide
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PS/LDPE
Spincast layer of PS/LDPE blend on Si.
Scanning Conditions
- System: NX20
- Scan Mode: Tapping
- Cantilever: AD40AS (k=40N/m, f=180kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel Size: 512 × 256
- Scan Mode: Tapping
- Cantilever: AD40AS (k=40N/m, f=180kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel Size: 512 × 256