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FrictionalForceMicroscopy Conductivity Hair Ni-FeAlloy Pzt PFM MBE Temasek_Lab CntFilm MLCC LDPE temp_control Sperm DiffractiveOpticalElements Ferrite epitaxy Deposition PinPointMode Multiferroic_materials Protein LateralForceMicroscopy Force-distance ThermalProperties InLiquid Treatment FrictionalForce CaMnO3 PolyvinylideneFluoride ContactMode MonoLayer Foil F14H20 OpticalModulator Silicon FM-KPFM
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MoS2 Layers on SiO2
A few layers of MoS2 on SiO2
Scanning Conditions
- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: NSC36Cr-Au B (k=2N/m, f=130kHz)
- Scan Size: 30μm×30μm
- Scan Rate: 0.3Hz
- Pixel Size: 512 × 256
- Scan Mode: AM-KPFM
- Cantilever: NSC36Cr-Au B (k=2N/m, f=130kHz)
- Scan Size: 30μm×30μm
- Scan Rate: 0.3Hz
- Pixel Size: 512 × 256