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SolarCell Metal Co/Cr/Pt LightEmiting kelvin probe force microscopy HiVacuum dielectric_trench doped Bacterium Conduct Zagreb Cross-section Resistance Copper Styrene AdhesionForce plastics Water Permalloy C_AFM CaMnO3 F14H20 Tapping HexagonalBoronNitride Defects CntFilm ElectroChemical self_healing phase_change non_contact CBD Annealed Deposition Patterns PS_LDPE
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Graphene_hBN Moiré Pattern
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 500nm×500nm,
- Scan Rate: 2Hz, 4Hz
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 500nm×500nm,
- Scan Rate: 2Hz, 4Hz
- Pixel: 256 × 256