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FailureAnalysis Logo mono_layer AnodizedAluminumOxide Cross-section Forevision Oxidation PECurve silicon_oxide Polyaniline hard_disk_media Defect Optoelectonics Gallium_Arsenide DOE PolymerBlend Monisha LiIonBattery ImideMonomer AM_SKPM ConductingPolymer SICM IRDetector light_emission Biofilm Nanofiber HiVacuum Electrode PolymerPatterns Austenite NiFe CastIron fluorocarbon ring shape Aluminium_Oxide
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Scanning Conditions
- System: XE7
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac