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Steps Electrical&Electronics PolymerPatterns Hole EPFL ElectrostaticForceMicroscopy PinpointNanomechanicalMode CaMnO3 FM_KPFM Crystal Carbon atomic_layer small_scan Modulus TiO2 Praseodymium AAO CalciumHydroxyapatite Mechanical Piezoresponse Zhi ferromagnetic bias_mode Moire Anneal Semiconductor Calcium VinylAlcohol MoS2 single_layer Adhesive hard_disk_media fe_nd_b DeflectionOptics Morphology
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BTO
Scanning Conditions
- System: XE7
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac