-
Magnetic Force Microscopy fe_nd_b Kevlar ItoGlass OpticalWaveguides Oxidation Korea Multiferroic_materials Ananth PhaseTransition PrCurve SRAM Flake Magnets AlkaneFilm LDPE cooling chemical_compound Styrene Phase ReflexLens Composition MembraneFilter domain_switching Growth #EC Ptfe Al2O3 Wildtype LowDensityPolyethylene Neodymium Polypropylene Praseodymium Piezoelectric AM_KPFM
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V