-
PolycrystallineFerroelectricBCZT PiezoelectricForceMicroscopy China Optoelectronic SiliconCrystal light_emitting plastics BCZT fifber HOPG MESA structure fe_nd_b SrO hetero_structure Calcium PolymerPatterns Galfenol Chungnam_National_University Ni-FeAlloy Trench HexacontaneFilm Techcomp thermoplastic_elastomers Conductivity C60H122 Oxidation semifluorinated alkane SPMLabs EFM DiffractiveOpticalElements Led domain_switching HumanHair Friction HighAspect
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V