Join us as we introduce you to automated AFM from Park Systems!

Visit our office in Santa Clara on Thursday, July 21, 2016 from 5pm - 7pm
as we serve some craft brew, bites to eat, and some friendly chatter as we all catch up on our work at the nanoscale and atomic force microscopy (AFM)!

Park Systems returns to SEMICON West in 2016 to exhibit our acclaimed atomic force microscopy solutions tailored for industry research and production applications.

While you visit us on the show floor at the Moscone Center, come by the ThirstyBear Brewing Company on Tuesday, July 12 as we host an Atomic Force Microscopy (AFM) Luncheon featuring talks from special guest speakers: Dr. Sang-il Park, Chairman & CEO of Park Systems and Dr. John Y. Chen, VP of Technology and Foundry Management at NVIDIA.

In partnership with the W.M. Keck Center for Nano-Scale Imaging of the University of Arizona, Park Systems is proud to announce a free workshop and live demo to take place on May 17, 2016 at the University of Arizona. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.

In partnership with the University of Maryland, Park Systems is proud to announce a free workshop and live demo to take place on May 24, 2016 at the University of Maryland. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.

In partnership with the Center for Nanoscale Systems, Park Systems is proud to announce a free workshop and live demo to take place on May 19, 2016 at Harvard University. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.