In partnership with the University of Münster, Park Systems is proud to announce a free workshop and live demo to take place on June 22, 2017 at the Center for Nanotechnology (CeNTech), University of Münster, Germany.

The workshop will provide a detailed introduction to the new key attributes of a modern AFM technology, such as True Non-Contact™ Mode and Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. During the subsequent instrument demonstration, you will have the opportunity to learn the innovative functionality of the Park NX10 System—a tool designed to enable the accurate and reproducible measurements in advanced research. The entire event is open to all interested parties and includes lunch.

• Evnet Start: 10am
• Location: Center for Nanotechnology (CeNTech), University of Muenster
• Directions: www.centech.de/index8.htm
• Program:
  - Morning talk: "SPM core & ancillary technology for advanced research"
  - Afternoon live demo: Park NX10 AFM

Park Systems and KFI(Katrin Field Incorporated) will hold the workshop with other companies in Philippines next week.

The workshop will cover topics such as Advanced Workflows in Science & Research(on 27 April) and Emerging New Technologies in Failure Analysis(on 28 April).

Park Systems will have presentation and AFM demo at the workshop.

• Event Date: 04-27-2017
• Event End Date: 04-28-2017
• Location: De La Salle University Science and Technology Complex Laguna Boulevard, LTI Spine Road, Binan City, Laguna, Philippines

April 10-11, 2017
Houston, Texas

Park Systems will be exhibiting at the Advanced Coatings and Characterization Methods Conference in Houston, TX April 10 and 11, 2017. Be sure to attend the presentation on advanced analytical methods with Atomic Force Microscopy featuring speaker Keibock Lee, President Park Systems on April 11 at 3pm.

Join Park Systems and fifteen other highly selected companies featuring Innovative Instrumentation and Products used in the Coatings industry on the exhibit floor from April 10-11. Learn from industry experts in coatings, material and characterization about the latest research and industry trends in Polymer Coatings and Nanostructured Materials, Corrosion and Characterization and Analytical Methods.

 Join us as we introduce you to the latest advances in AFM metrology featuring a talk titled "In-line (3D) AFM as Solution Provider for Beyond N10 Process" from imec Senior Researcher, Dr. Tae-Gon Kim!

Visit our office in Santa Clara on Friday, March 23, 2017 from 5pm - 7pm as we serve some craft brew, bites to eat, and some friendly chatter as we all catch up on our work at the nanoscale and atomic force microscopy (AFM)!

Park Systems visits downtown San Jose to hold a luncheon alongside the 2017 SPIE Advanced Lithography conference. After the world's premier lithography event kicks off its programming on Monday, February 27, join us just a block away from the San Jose Convention Center at Morton's The Steakhouse for lunch and to learn about the latest advances in nanoscale characterization for the semiconductor industry