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Scanning_Thermal_Microscopy Phosphide MESA structure polymeric_arrays KelvinProbeForceMicroscopy Hafnia PolyvinylAcetate tip_bias_mode Sadowski Defect Graphene Nickel Film SRAM MagneticForceMicroscopy Epoxy DiffractiveOpticalElements PvdfBead Vortex ElectroDeposition bias_mode LiftHeight StainlessSteel ScanningKelvinProbeMicroscopy Wang Adhesion ForceMapping Titanate Bacterium fluoroaalkane Conducting Oxide SurfaceChange Galfenol LiBattery
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Sperm with defect
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate:0.2Hz
- Pixel: 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate:0.2Hz
- Pixel: 512×512