-
NiFe MagneticForceMicroscopy MechanicalProperties pinpoint mode IcelandSpar Ferrite Mapping small_scan Optoelectronic Step DNA TemperatureControllerAFM Bio FM_KPFM MonoLayer Genetic NUS_NNI_Nanocore Cell Metal-organicComplex KAIST H-BN AEAPDES SAM Magnetic layers Mechanical&nanotechnology NCM\ Galfenol chemical_compound Led ThinFilm TiO2 Ceramic HardDiskMedia Flake
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
CrAu surface
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256