-
self-assembled_monolayer Ananth RedBloodCell Metal LiftMode Sapphire Carbon Vac rubber HighAcpectRatio Non-ContactMode atomic_steps ThermalConductivity Ptfe BismuthVanadate SurfaceChange PtfeFilter PVA Cross-section hydrocarbon Forevision Gallium CancerCell HafniumDioxide PECurve Plug LeakageCurrent KevlarFiber Tin disulfide Formamidinium_lead_iodide STM FailureAnalysis 2d_materials FuelCell Mechanical&nanotechnology
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126