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ScratchMode VerticalPFM Polyaniline PiezoelectricForceMicroscopy MESA structure PetruPoni AIN UnivMaryland Wafer Granada Ferroelectric nanobar Gold LifeScience Fet Heat Copper TemperatureControlledAFM FrictionForce graphene_hybrid DOE HighAcpectRatio Sphere OxideLayer Polyethylene plastics Yttria_stabilized_Zirconia Magnets PVA cooling Fiber Barium_titanate aluminum_nitride hetero_structure CeNSE_IISc
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Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126