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Friction Piezoelectric MESA structure Ceramics conductive TipBiasMode mechanical property Styrene aluminum_nitride Optoelectonics SrO FM_KPFM NusEce Polarization HBN Sapphire Ram TemperatureControllerStage Composition BoronNitride PiezoelectricForceMicroscopy Grain pulsed_laser_deposition Filter Fluoride OpticalModulator vertical_PFM LiftMode CopperFoil IcelandSpar CrAu MolecularSelfAssembly Typhimurium PolycrystallineFerroelectricBCZT Ananth
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Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126