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Conducting Boundary ScratchMode BTO MoirePattern nanobar Reading HydroGel NCM Chungnam_National_University Aluminium_Oxide Pore C36H74 SmallScan LiNbO3 Sperm AmplitudeModulation MultiLayerCeramicCapacitor Alloy self-assembled_monolayer Hafnium_dioxide INSP amplitude_modulation Scanning_Thermal_Microscopy SrTiO3 DiffractiveOpticalElements I-VSpectroscopy PolycrystallineFerroelectricBCZT mfm_amplitude LiftHeight Worcester_Polytechnic_Institute Korea fluoroalkane PANI Gallium_Arsenide
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Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126