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Inorganic Anneal Wang PhthalocyaninePraseodymium Hexacontane BTO Resistance nanomechanical Vanadate Collagen FAPbI3 ElectroDeposition Cell IRDetector SetpointMode FFM Pores LeakageCurrent exfoliate SKPM SSRM LifeScience LiftHeight TemperatureControllerAFM AtomicLayer piezoelectric force microscopy Subhajjit Stiffness Cobalt-dopedIronOxide electrospinning tip_bias_mode OpticalModulator mechanical_property vertical_PFM HanyangUniv
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Cutting Graphene
Scanning Conditions
- System : FX40
- Scan Mode: Contact after lithography
- Scan Rate : 0.7 Hz
- Scan Size : 30μm×30μm
- Pixel Size : 256×256
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)
- Lithography condition : Force 500 nN, writing speed 0.1μm/s, AC bias 10 V @ 40kHz