-
HexagonalBoronNitride TCS LeakageCurrent CaMnO3 Indium_tin_oxide Aluminium_Oxide PECurve non_contact IVSpectroscopy Hafnia ElectrostaticForceMicroscopy MagneticForce Sic CopperFoil Insulator HafniumDioxide HDD FM_SKPM AM_KPFM Patterns hard_disk_media Zhi Ito LiftMode Ram Ferroelectric SPMLabs atomic_steps 2d_materials KelvinProbeForceMicroscopy Battery PolymerPatterns Silicon Nickel SoftSample
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Strainded MoS₂ on Si
Scanning Conditions
- System : FX40
- Scan Mode: Sideband KPFM
- Scan Rate : 0.15Hz
- Scan Size : 50μm×13μm
- Pixel Size : 2048×1024
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)