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CuParticle Ito Styrene Aluminium_Oxide ConductiveAFM FAPbI3 GaP ForceMapping H-BN Cobalt Nickel Jason contact MultiferroicMaterials SolarCell PolymerBlend Yttria_stabilized_Zirconia PMNPT layers Piezo GranadaUniv Annealed aluminum_nitride MolybdenumDisulfide Electronics CalciumHydroxyapatite Beads self-assembly Mapping Melt OrganicSemiconductor Genetic SmalScan MagneticForceMicroscopy Laser
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Mo film
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 0.5 Hz, 0.8 Hz
- Scan Size : 5μm2, 15μm2
- Pixel Size : All 1024×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)