-
India epitaxy vertical_PFM Neodymium Jason Sphere Nickel ForceVolumeMapping GaAs Leakage TungstenDeposition Praseodymium PatternedSapphireSubstrat molecular_self_assembly Platinum fifber FrictionalForceMicroscopy Austenite Silver OpticalWaveguides SmallScan Perovskite oxide_layer Treatment SRAM mechanical property Semiconductor Led HDD cooling DNA Scratch ScanningThermalMicroscopy small_scan IndiumTinOxide
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
P(VDF-TrFE-CFE)
Scanning Conditions
- System : FX40
- Scan Mode: Tapping
- Scan Rate : 0.5 Hz
- Scan Size : 2μm×2μm
- Pixel Size : 512×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)