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SicMosfet Formamidinium_lead_iodide Composition Tungsten HighAcpectRatio TemperatureControl I-VSpectroscopy TappingMode Polyimide temperature_control Electronics IcelandSpar Friction AmplitudeModulation self-assembly Steps Solution PMNPT Wafer NUS_Physics SoftSample Electical&Electronics SKPM BismuthFerrite Hexacontane Cobalt PetruPoni_Institute TungstenDeposition HexacontaneFilm Self-assembledMonolayer Array LiquidImaging CrAu ConductingPolymer YttriaStabilizedZirconia
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GaN epi wafer
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 0.7 Hz
- Scan Size : 5μm×5μm
- Pixel Size : 512×512
- Cantilever : PPP-NCHR (k=42N/m, f=330kHz)