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Croatia AdhesionEnergy MechanicalProperties cooling NtuEee atomic_layer Reading Non-ContactMode frequency_modulation TemperatureControlledAFM Hexylthiophene Indent SThM Cell BiVO4 VortexCore LightEmiting Chloroform ThermalProperties nanobar CalciumHydroxyapatite KPFM Domain IVSpectroscopy MoirePattern Scanning_Thermal_Microscopy CastIron HACrystal Spain PinpointNanomechanicalMode Electrical&Electronics Bismuth Sadowski self_assembly Kevlar
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BN thin film on Si
Scanning Conditions
- System: NX10
- Scan Mode:SThM
- Cantilever: Nanothermal probe
- Scan Size: 25μm×25μm, 5μm×5μm
- Scan Rate:0.3Hz, 0.5Hz
- Pixel: 256×256, 256×256
- Scan Mode:SThM
- Cantilever: Nanothermal probe
- Scan Size: 25μm×25μm, 5μm×5μm
- Scan Rate:0.3Hz, 0.5Hz
- Pixel: 256×256, 256×256