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TappingMode ElectrostaticForceMicroscopy UnivCollegeLondon Mechanical&nanotechnology ThermalProperties ShenYang ThermalDetectors BTO C60H122 Platinum ScratchMode AM-KPFM semifluorinated_alkanes NUS Carbon FM_KPFM semifluorinated_alkane Permalloy Force-distance University_of_Regensburg PinpointNanomechanicalMode Blood LiBattery BaTiO3 mechanical_property cannabidiol Tungsten_disulfide pinpoint mode nanomechanical heterojunctions Film FrictionalForceMicroscopy Ni-FeAlloy Ram Optoelectonics
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HfO2
Scanning Conditions
- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: ElectriMulti75 (k=3 N/m, f=75kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 256×256