-
FailureAnlaysis SrTiO3 Tapping Corrosion Aluminium_Oxide Wang LeakageCurrent OpticalWaveguides NusEce SurfaceOxidation Celebration Etch Stiffness UnivMaryland self_assembly SiWafer AtomicSteps LiIonBattery FailureAnalysis OxideLayer InsulatorFilm HACrystal ConductingPolymer Patterns epitaxy atomic_layer Flake piezoelectric force microscopy Pores Polytetrafluoroethylene Leakage Worcester_Polytechnic_Institute TransitionMetal LightEmission IIT-chennai
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Defects of Reflex lens
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×512