-
semifluorinated_alkane Anneal GaAs ContactMode CntFilm DIWafer Chungnam_National_University SolarCell ConductingPolymer Adhesion MagneticForceMicroscopy PhaseImaging Polyvinylidene_fluoride ForceMapping PDMS SFAs Al2O3 MagneticPhase Oxide EFMAmplitude GlassTemp CrAu Gallium_Arsenide HumanHair Alloy INSPParis FastScan MagneticForce temperature controller AFM Gong Magnetic Force Microscopy SicMosfet Sphere Inorganic Permalloy
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
AR Lens
Scanning Conditions
- System : FX40
- Scan Mode: Non-contact
- Scan Rate : 0.5 Hz for 40μm2, 1.5 Hz for 5μm2, 2μm2
- Scan Size : 40μm2, 5μm2, 2μm2
- Pixel Size : 2048×512 for 40μm2, 5μm2, 1024×256 for 2μm2
- Cantilever : OMCL-AC55TS (k=85N/m, f=1.6kHz)