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ConductingPolymer polymeric_arrays Yttria_stabilized_Zirconia PDMS STO phase_change Mobile PatternedSapphireSubstrat CalciumHydroxide Liquid CuSubstrate SmallScan 2dMaterials MagneticForceMicroscopy ThermalConductivity Pipette AM_SKPM Force-distance TappingMode PolyvinylideneFluoride mono_layer Leakage hydrocarbon CuFoil GlassTemp SThM HafniumDioxide Metal-organicComplex BoronNitride PinPointMode IVSpectroscopy KPFM VinylAlcohol Ceramics StainlessSteel
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TSV Cu pad oxidation
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : All 1 Hz
- Scan Size : 40μm×40μm
- Pixel Size : All 512×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)