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TempControl Roughness molecular_self_assembly TyphimuriumBiofilm MembraneFilter CntFilm TungstenDeposition Defects cannabis Cobalt-dopedIronOxide Graphite Spain Jason high_resolution atomic_layer LiquidImaging Metal-organicComplex StyreneBeads SmalScan 3-hexylthiophene PS_PVAC PolymerPatterns Annealed Perovskite SetpointMode PolyimideFilm PiezoelectricForceMicroscopy UTEM Pvdf PolycrystallineFerroelectricBCZT Pore MESA structure cross section Sulfur CuSubstrate
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TSV Cu pad oxidation
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : All 1 Hz
- Scan Size : 40μm×40μm
- Pixel Size : All 512×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)