-
KPFM graphene_hybrid VortexCore neodymium_magnets Silver DeoxyribonucleicAcid Carbon CP-AFM University_of_Regensburg Workfunction CHRYSALIS_INC Optoelectronic Litho PolymerPatterns Vortex Fendb conductive HACrystal Logo phase_change Blend ReflexLens Boron cannabis C60H122 NiFe heterojunctions light_emission OpticalModulator AdhesionEnergy Platinum Polyvinylidene_fluoride GalliumPhosphide Ptfe PinpointNanomechanicalMode
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Semiconductor device, W-plug
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: ElectriMulti75-G (k=3N/m, f=75kHz)
- Scan Size: 2μm×1μm
- Scan Rate: 0.3Hz
- Pixel: 512×256
- Sample bias: +1V