-
LogAmplifier ThermalDetectors Hexylthiophene India Pores ThinFilm Aluminium_Oxide multi_layer IMT_Bucharest Dimethicone Platinum OpticalWaveguide MagneticPhase dielectric trench SKPM Mapping Molybdenum_disulfide ContactMode LowDensityPolyethylene Glass Growth MolybdenumDisulfide PolyvinylideneFluoride Permalloy single_layer PANI Protein Korea MoS2 UTEM Fe_film Ram PetruPoni_Institute Defect PrCurve
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Mechanical Exfoliated WS2
Scanning Conditions
- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: NSC36Cr-Au A (k=1N/m, f=90kHz)
- Scan Size: 15μm×15μm
- Scan Rate: 0.4Hz
- Pixel: 512 × 256
- Scan Mode: AM-KPFM
- Cantilever: NSC36Cr-Au A (k=1N/m, f=90kHz)
- Scan Size: 15μm×15μm
- Scan Rate: 0.4Hz
- Pixel: 512 × 256