表面工学

Microscopic Mapping: Post Application Treated Silanefilm

Material

Si/SiO₂-substrate with an applied layer of (3-Glycidyloxypropyl)- trimethoxysilane (GLYMO)

3-Glycidyloxypropyl)-trimethoxysilane (GLYMO)

Experimental

Delta and Psi-Maps were recorded with an spectroscopic imaging ellipsometer nanofilm_ep4 at a wavelength of 400 nm. The system was equipped with a 10x objective and the focus scanner was used

Results

Microscopic Delta map of post application treated silane films.

Reference

Peter H. Thiesen, Philipp Jähde (2018) Compendium, Characterizing Silanized Surfaces with Imaging Ellipsome
https://www.researchgate.net/publication/326740970_Characterizing_Silanized_Surfaces_with_Imaging_Ellipsometry