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Reduction Hexylthiophene Electical&Electronics PhaseChange Sio2 Jason Optic LateralForceMicroscopy CNT MfmAmplitude Boundary IIT-chennai Singapore WPlug Formamidinium_lead_iodide IcelandSpar Hole Granada Ananth hydrocarbon NeodymiumMagnets Sic Ptfe Scratch Piezoresponse NCM\ LithiumNiobate Temasek_Lab Vortex ForceMapping kelvin probe force microscopy Conductive AFM FrictionalForceMicroscopy IISCBangalore SRAM
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Block copolymer thin film
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm, 1μm×1μm
- Scan Rate: 0.5Hz, 1Hz
- Pixel: 512×512, 512×512
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm, 1μm×1μm
- Scan Rate: 0.5Hz, 1Hz
- Pixel: 512×512, 512×512