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Techcomp Copolymer high_resolution DOE Inorganic Phase Adhesive HexacontaneFilm MBE #Materials Scratch MetalCompound IISCBangalore SicMosfet Leakage TungstenDeposition mechanical property temperature_control semifluorinated_alkanes HBN Nanofiber Au111 SiWafer Moire bias_mode Patterns Annealing CBD PolyvinylideneFluoride VinylAlcohol Chrome TemperatureControl PinpointNanomechanicalMode MeltingPoint molecular_self_assembly
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CNT Film
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V