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pinpoint mode Magnetic Force Microscopy Non-ContactMode ItoGlass LFM Piezoelectric semifluorinated_alkanes FrictionalForce Composite Bmp Molybdenum_disulfide Composition Tin disulfide WWafer Sphere HfO2 TiO2 TappingMode Phase HardDiskMedia Topography WS2 Genetic Fet MLCC mechanical_property temp PrCurve Carbon NiFe Electical&Electronics PhthalocyaninePraseodymium block_copolymer molecular_self_assembly AmplitudeModulation
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SnS2 Flakes
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC240TS (k=2N/m, f=70kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.4Hz
- Pixel Size: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC240TS (k=2N/m, f=70kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.4Hz
- Pixel Size: 256 × 256