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FAFailureAnlaysis Magnetic AmplitudeModulation MultiLayerCeramicCapacitor lithography Carbon dichalcogenide ForceVolume AIN PS_PVAC Chemical Vapor Deposition Perovskite ImideMonomer Writing Aluminum Microchannel self_assembly Electrode ring shape Bio Device Barium_titanate Change Calcite SKPM MagneticForce NTU Austenite Hexacontane 2d_materials IIT-chennai Zagreb doped Morphology HACrystal
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Patterned Sapphire Substrate (PSS)
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR
- Scan Size: 40μm×40μm, 3μm×3μm
- Scan Rate: 0.3Hz, 1Hz
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR
- Scan Size: 40μm×40μm, 3μm×3μm
- Scan Rate: 0.3Hz, 1Hz
- Pixel: 256 × 256