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Cobalt-dopedIronOxide SoftSample Dopped Polyethylene Trench SThM TemperatureControllerAFM InsulatorFilm Morphology align Bismuth MetalCompound Tungsten C36H74 MoirePattern Phenanthrene InLiquid polyvinyl acetate ConductiveAFM Typhimurium StrontiumTitanate PolyStylene strontiu_titanate HfO2 SolarCell Fiber Granada Annealing Co/Cr/Pt MagneticArray LightEmiting Polyimide Pinpoint PFM Hafnia TungstenDeposition
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Imprint sample
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate:0.25Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate:0.25Hz
- Pixel: 256×256