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PtfeFilter EPFL Adhesive CP-AFM epitaxy strontiu_titanate LeakageCurrent DataStorage SrTiO3 Praseodymium self_healing Barium_titanate SingleLayer Ni-FeAlloy ring shape Blend domain_switching lithography Au111 VerticalPFM ContactModeDots temperature_control Pattern Copper TemperatureControl ScanningKelvinProbeMicroscopy CuSubstrate Annealed SetpointMode LogAmplifier FrictionalForceMicroscopy Mosfet Film AEAPDES Polystyrene
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Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126