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NCM\ Metal Vacuum CrystalGrowing Nanotechnology BCZT ElectrostaticForceMicroscopy CrAu AdhesionEnergy Workfunction WPlug NusEce mechanical property TiO2 polyvinyl acetate MagneticArray SKKU Oxidation AIN atomic_steps temp_control IMT_Bucharest SiliconOxide Melt conductive NtuEee Heat thermal_conductivity domain_switching MagneticForceMicroscopy ScanningKelvinProbeMicroscopy Deposition #EC frequency_modulation BTO
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Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 0.250μm×0.250μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 0.250μm×0.250μm
- Scan Rate: 0.5Hz
- Pixel: 512×512