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Bismuth FFM LogAmplifier SiliconeOxide Deposition StrontiumTitanate UTEM light_emission CBD CP-AFM ito_film EvatecAG BiVO4 hard_disk_media Polystyrene Imprint IndiumTinOxide Composite bias_mode doped LiftHeight ScanningIon-ConductanceMicroscopy Ferroelectric BCZT Steps blended polymers Crystal Switching PVAC ForceVolumeImage LightEmiting LiBattery SurfaceOxidation MultiferroicMaterials PS_PVAC
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Perovskite coated on glass with Palladium electrodes
Scanning Conditions
- System : FX40
- Scan Mode: Sideband KPFM
- Scan Rate : All 0.4 Hz
- Scan Size : 40μm×40μm
- Pixel Size : All 256×256
- Cantilever : NSC36 Pt C(k=0.6N/m, f=65kHz)