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Reading Alkane thermoplastic_elastomers domain_switching MonoLayer Semiconductor Kevlar LeakageCurrent pulsed_laser_deposition Neodymium Chemical Vapor Deposition Electrode Litho BiFeO3 Formamidinium_lead_iodide LFM Yeditepe Hexylthiophene piezoelectric force microscopy TemperatureControlledAFM aluminum_nitride Composition SetpointMode Metal-organicComplex CuSubstrate IndiumTinOxide Temasek_Lab Memory hard_disk FM_KPFM SiliconOxide ForceVolumeImage Heating Ferroelectric Mfm
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Strainded MoS₂ on Si
Scanning Conditions
- System : FX40
- Scan Mode: Sideband KPFM
- Scan Rate : 0.15Hz
- Scan Size : 50μm×13μm
- Pixel Size : 2048×1024
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)